WLAN Driver Memory Corruption Vulnerability
CVE-2024-43050
7.8HIGH
Summary
Memory corruption while invoking IOCTL calls from user space to issue factory test command inside WLAN driver.
Affected Version(s)
Snapdragon = AQT1000
Snapdragon = FastConnect 6200
Snapdragon = FastConnect 6700
CVSS V3.1
Score:
7.8
Severity:
HIGH
Confidentiality:
High
Integrity:
High
Availability:
High
Attack Vector:
Local
Attack Complexity:
Low
Privileges Required:
Low
User Interaction:
None
Scope:
Unchanged
Timeline
Vulnerability published.
Vulnerability Reserved.
Collectors
NVD DatabaseMitre Database