Memory Corruption Vulnerability in Qualcomm Products
CVE-2024-45573

7.8HIGH

Key Information:

Vendor
Qualcomm
Status
Snapdragon
Vendor
CVE Published:
3 February 2025

Summary

A memory corruption issue arises during the generation of a test pattern due to negative indexing of the display ID in Qualcomm's device firmware. This flaw can lead to unexpected behavior and potential vulnerabilities in devices running affected versions, impacting overall system integrity.

Affected Version(s)

Snapdragon Snapdragon Compute FastConnect 6700

Snapdragon Snapdragon Compute FastConnect 6900

Snapdragon Snapdragon Compute FastConnect 7800

References

https://docs.qualcomm.com/product/publicresources/securit...

CVSS V3.1

Score:
7.8
Severity:
HIGH
Confidentiality:
High
Integrity:
High
Availability:
High
Attack Vector:
Local
Attack Complexity:
Low
Privileges Required:
Low
User Interaction:
None
Scope:
Unchanged

Timeline

  • Vulnerability published

  • Vulnerability Reserved

.