Memory Corruption Vulnerability in Qualcomm IOCTLs
CVE-2024-45578
7.8HIGH
Summary
A memory corruption vulnerability has been identified in Qualcomm's handling of IOCTLs during the validation of IFE output resource IDs. This issue arises when acquiring and updating IOCTLs, leading to potential unauthorized access and instability within affected systems. Users are advised to apply the available security updates to mitigate any risks associated with this vulnerability.
Affected Version(s)
Snapdragon Snapdragon Compute FastConnect 6900
Snapdragon Snapdragon Compute FastConnect 7800
Snapdragon Snapdragon Compute SDM429W
References
CVSS V3.1
Score:
7.8
Severity:
HIGH
Confidentiality:
High
Integrity:
High
Availability:
High
Attack Vector:
Local
Attack Complexity:
Low
Privileges Required:
Low
User Interaction:
None
Scope:
Unchanged
Timeline
Vulnerability published
Vulnerability Reserved