Memory Corruption in Qualcomm Products Due to Test Pattern Generator IOCTL Command
CVE-2024-53017

6.6MEDIUM

Key Information:

Vendor

Qualcomm
Status
Snapdragon
Vendor
CVE Published:
3 June 2025

What is CVE-2024-53017?

A memory corruption vulnerability has been identified in Qualcomm products when handling IOCTL commands related to the test pattern generator. This issue could lead to unexpected behavior and potential exploitation pathways, highlighting the need for timely patches and security updates.

Affected Version(s)

Snapdragon Snapdragon Wearables SDM429W

Snapdragon Snapdragon Wearables Snapdragon 429 Mobile Platform

Snapdragon Snapdragon Wearables WCN3620

References

https://docs.qualcomm.com/product/publicresources/securit...

CVSS V3.1

Score:
6.6
Severity:
MEDIUM
Confidentiality:
Low
Integrity:
High
Availability:
Low
Attack Vector:
Local
Attack Complexity:
Low
Privileges Required:
Low
User Interaction:
None
Scope:
Unchanged

Timeline

  • Vulnerability published

  • Vulnerability Reserved

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CVE-2024-53017 : Memory Corruption in Qualcomm Products Due to Test Pattern Generator IOCTL Command