Memory Corruption in Qualcomm Products through Escape Call Handling
CVE-2025-21423
7.8HIGH
Summary
A memory corruption issue arises in Qualcomm products when processing client calls to EnableTestMode via an Escape call. This vulnerability could lead to unauthorized access or manipulation of system resources, posing potential risks to the integrity and security of affected systems.
Affected Version(s)
Snapdragon Snapdragon Compute AQT1000
Snapdragon Snapdragon Compute FastConnect 6200
Snapdragon Snapdragon Compute FastConnect 6700
References
CVSS V3.1
Score:
7.8
Severity:
HIGH
Confidentiality:
High
Integrity:
High
Availability:
High
Attack Vector:
Local
Attack Complexity:
Low
Privileges Required:
Low
User Interaction:
None
Scope:
Unchanged
Timeline
Vulnerability published
Vulnerability Reserved